Applications for this prestigious award are invited by 30 November 2018.
In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for...
Raman, infrared, x-ray photoelectron and ultraviolet/visible spectroscopies are being used at the University of Liverpool to help develop better energy storage devices.
The use of time-of-flight secondary ion mass spectrometry imaging to examine the skin can reduce the number of animal experiments while providing new opportunities to develop pharmaceuticals and cosmetics.
The Thermo Scientific Nexsa surface analysis system integrates XPS with additional techniques for correlative analysis in materials research.
Horiba Scientific’s new Uvisel Plus reference ellipsometer includes the latest generation of FastAcq technology for increased measurement accuracy.
Achema 2018 is inviting contributions to the Achema Congress and the PRAXISforums; deadline 22 September 2017.
A cooperation between Messe München India and the Indian Pharma Machinery Manufacturers Association (IPMMA) will collocate events jointly representing 600+ global and Indian companies.
Titanium dioxide (TiO2) is one of the most promising materials for photovoltaics and photocatalysis nowadays. This material appears in different crystalline forms, but the most attractive one for applications is “anatase”. EPFL scientists have now shed light onto the problem by a combination of steady-state and ultrafast spectroscopic techniques, as well as theoretical calculations...
A new description of electron scattering in the surface layers of samples proposed by the Institute of Physical Chemistry of the Polish Academy of Sciences in Warsaw significantly speeds up materials analysis and enables a better understanding of what can really be seen in a sample.
New spectroscopy releases at Pittcon 2016, along with links to further information.
RBD Instruments have release the microCMA, compact cylindrical mirror analyser (CMA) for Auger electron spectroscopy.
Tiny beads of volcanic glass found on the lunar surface during the Apollo missions are a sign that fire fountain eruptions took place on the Moon’s surface. Now, using secondary ion mass spectrometry, scientists from Brown University and the Carnegie Institution for Science have identified the volatile gas that drove those eruptions.
Silver is often used as a coating on medical equipment used for chemotherapy, but this silver coating can break down drugs. With the help of XPS, researchers have found a graphene coating that will help boost the effect of chemotherapy.
The US Naval Research Laboratory has a new Local Electrode Atom Probe instrument to help in the engineering of new materials.
Super-eruptions are not the only type of eruption to be considered when evaluating hazards at volcanoes with protracted eruption histories, such as the Yellowstone (Wyoming), Long Valley (California), and Valles (New Mexico) calderas in the USA. There have been more than 23 effusive eruptions of rhyolite lava at Yellowstone since the last caldera-forming eruption ~640,000 years ago, all of...
Karsten Hinrichs and Andreas Furchner describe “Infrared mapping spectroscopic ellipsometry”. Recent developments in fundamental and materials research have increased the value of mapping techniques such as ellipsometry. IR ellipsometry, since it operates in the mid-IR fingerprint region, provides complementary information on composition, structural properties and interactions
A complication and barrier to wider uptake of SIMS, especially for organic materials, is the complexity of the mass spectrum. The G-SIMS method (from gentle-SIMS) was developed to simplify the spectra and provide direct interpretation based on the physics and chemistry of the SIMS process rather than on statistical analysis techniques such as principal component analysis or library matching...
The purpose of this article is to give a comparative description of two methods applying ion-beam sputtering in materials research: secondary ion and neutral mass spectrometries (SIMS and SNMS). We shall illustrate the application of the latter by reports on a compositional analysis of perovskite oxides and on an investigation of nanoscaled multilayer structures.
John F. Watts
Surrey Materials Institute and School of Engineering, University of Surrey, Guildford, Surrey GU2 7XH, UK. E-mail: email@example.com
Alan J. Paul
CSMA, CERAM, Queens Road, Stoke-on-Trent, ST4 7LQ, UK
Carla Bittencourt, Marcella P. Felicissimo, Jean-Jacques Pireaux and Laurent Houssiau
Laboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Facultés Universitaires Notre-Dame de la Paix, University of Namur, 61 rue de Bruxelles, B-5000 Namur, Belgium
Frank Rutten,* Julian Hendersona and David Briggs
School of Pharmacy and Centre for Surface Chemical Analysis,
aDepartment of Archaeology, School of Humanities, University of Nottingham, University Park, Nottingham NG7 2RD, UK
*Correspondence to: Frank Rutten, School of Pharmacy, University of Nottingham University Park, Nottingham...
Antonella Rossi,a,b Bernhard Elsenera and Nicholas D. Spencerb
aDepartment of Inorganic and Analytical Chemistry, University of Cagliari, Campus of Monserrato, 09100 Cagliari, Italy
bLaboratory for Surface Science and Technology, Department of Materials, ETH-Hönggerberg, Wolfgang-Pauli-Strasse 10, CH-8093 Zürich,...
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